24th IEEE International Symposium
on On-Line Testing and Robust System Design
(IOLTS'18)
July 2-4, 2018
Hotel Cap Roig, Platja dAro, Costa Brava, Spain
http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts18
“IOLTS 2018 Submissions Site will remain open for Paper Submission till Friday March 2, 2018 AOE (Anywhere-on-Earth).”
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CALL FOR PAPERS
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Issues related to On-line testing techniques, and more generally
to design for robustness, are increasingly important in modern
electronic systems. In particular, the huge complexity of
electronic systems has led to growth in reliability needs in
several application domains as well as pressure for low cost
products. There is a corresponding increasing demand for
cost-effective design for robustness techniques. These needs have
increased dramatically with the introduction of nanometer
technologies, which impact adversely noise margins; process,
voltage and temperature variations; aging and wear-out; soft error
and EMI sensitivity; power density and heating; and make mandatory
the use of design for robustness techniques for extending, yield,
reliability, and lifetime of modern SoCs. Design for reliability
becomes also mandatory for reducing power dissipation, as voltage
reduction, often used to reduce power, strongly affects reliability
by reducing noise margins and thus the sensitivity to soft-errors
and EMI, and by increasing circuit delays and thus the severity of
timing faults. There is also a strong relation between Design for
Reliability and Design for Security, as security attacks are often
fault-based.
The International Symposium on On-Line Testing and Robust System
Design (IOLTS), is an established forum for presenting novel ideas
and experimental data on these areas. The Symposium is sponsored by
the IEEE Council on Electronic Design Automation (CEDA) and the
2018 edition is organized by the IEEE Computer Society Test
Technology Technical Council, the University of Athens, and the
TIMA Laboratory.
- The topics of interest include (but are not limited to) the
following ones:
- Quality, yield, reliability and lifespan issues in nanometer
technologies
- Variability, Aging, EMI, and Radiation Effects in nanometer
technologies
- Self-Test and Self-Repair
- Design-for-Reliability
- On-line testing techniques for digital, analog and mixed-signal
circuits
- Self-checking circuits and coding theory
- On-line monitoring of current, temperature, process variations,
and aging
- Self-Healing design
- Self-Regulating design
- Self-Adapting design
- Cross-layer reliability approaches
- Reliability issues of Low-Power Design
- Design for Reliability approaches for Low-Power
- Power density and overheating issues in nanometer
technologies
- Fault-Tolerant and Fail-Safe systems
- Dependable system design
- Field Diagnosis, Maintainability, and Reconfiguration
- Design for Security
- Fault-based attacks and counter measures
- Design for Robustness for automotive, railway, avionics, space,
large industrial applications, IT infrastructure, cloud computing,
and wired, cellular and satellite communications
- Robustness evaluation
- CAD for robust circuits design
IEEE Transactions on Device and Materials
Reliability (TDRM) Special Issue dedicated to IOLTS 2018: A
Special Issue of the prestigious IEEE Transactions is dedicated to
IOLTS 2018. Authors of the most highly ranked IOLTS 2018 papers
will be invited to submit extended versions of their work shortly
after the symposium for review for the Special Issue. Detailed
timeline will be announced shortly.
This year IOLTS puts particular emphasis on the topics of:
- Robust Automotive Electronics
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- Design for Robustness is gaining importance in Automotive
electronics, due to their stringent Reliability, Security, and
Extended Lifespan constraints, which are strongly impacted by the
rapidly increasing complexity of automotive electronics and
advanced nanometric processes
- Design for Robustness versus Design for
Low-Power
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- Design for Security, as well as Fault Mitigation techniques
used for improving Yield, Reliability, and Lifespan, may increase
power dissipation. Thus, targeting low-power penalties when
developing Design for Robustness approaches is becoming
mandatory.
- Voltage reduction (often used to reduce power), strongly
affects yield, reliability, and lifespan, by reducing noise margins
and thus the sensitivity to EMI and soft-errors; an by increasing
circuit delays and thus the severity of timing faults; as well as
by further weakening to the point of failure cells that are weak
(due to process variations and aging) but not yet failing.
- Last but not least, drastic power reduction can be achieved by
means of fault mitigation approaches (like those used in Design for
Reliability, Yield, and Lifespan techniques); by reducing
aggressively the supply voltage and using these approaches to
mitigate the failures induced by this reduction.
- Design for Robustness and Test for Mixed Signal
Systems, supported by the Integration of IMSTW at
IOLTS
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- For more information about this integration please visit the
site:
http://tima.univ-grenoble-alpes.fr/conferences/imstw/imstw18/
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The IOLTS Committee invites authors to submit papers in the
above or related technical areas. Accepted papers and posters will
be included in formal Proceedings to be published by the IEEE.
Papers must be submitted electronically following the instructions
provided at the symposium web site. Papers should be in the
standard IEEE conferences double-column format. If accepted,
regular papers should be allowed six pages in the IEEE proceedings
of IOLTS.
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Submission deadline: March 2, 2018
Notification of acceptance: March 30, 2018
Camera-ready papers due: April 23, 2018
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Additional Information |
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Submission Information:
Dimitris Gizopoulos University of
Athens
Athens, Greece
Tel: +30 210 7275145
dgizop@di.uoa.gr
Dan Alexandrescu iRoC Technologies
Grenoble, France
Tel: +33 (0) 4 38 12 07 63
dan.alexandrescu@iroctech.com
General Information:
Michael Nicolaidis TIMA Laboratory
Grenoble, France
Tel: +33 (0) 4 76 57 46 96
michael.nicolaidis@univ-grenoble-alpes.fr
Antonio Rubio UPC
Barcelona, Spain
Tel +34 934 017 485
antonio.rubio@upc.edu
Federative Event on Design for Robustness
(FEDfRo): IOLTS’18 is held as part of the 3rd Federative
Event on Design for Robustness (FEDfRo). For all details about the
event see:
http://tima.univ-grenoble-alpes.fr/conferences/fedfro/fedfro18/.
About the location: IOLTS 2018 will be held at
Platja d’Aro, Costa Brava, Spain. The area offers a brilliant
experience, with so much to offer: a beautiful natural setting,
culture, leisure, sport and a delightful seafront location, with an
impressive, endless beach, and idyllic little bays.
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IOLTS’18 is sponsored
by the Institute of Electrical and Electronics Engineers (IEEE)
Computer Society's Test Technology Technical Council
(TTTC).
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